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Welcome to Keck CAMM | Keck Center for Advanced Microscopy and Microanalysis

The W. M. Keck Center for Advanced Microscopy and Microanalysis (Keck CAMM) has been established since 2001 through generous grants from the W. M. Keck ...

http://camm.udel.edu/

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Welcome to Keck CAMM | Keck Center for Advanced Microscopy and Microanalysis | camm.udel.edu Reviews
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Welcome to Keck CAMM | Keck Center for Advanced Microscopy and Microanalysis | camm.udel.edu Reviews

https://camm.udel.edu

The W. M. Keck Center for Advanced Microscopy and Microanalysis (Keck CAMM) has been established since 2001 through generous grants from the W. M. Keck ...

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Gallery | Keck Center for Advanced Microscopy and MicroanalysisKeck Center for Advanced Microscopy and Microanalysis

http://www.camm.udel.edu/gallery

Keck Center for Advanced Microscopy and Microanalysis. Fees & Rates. Auriga 60 CrossBeam (FIB/FE-SEM). Talos F200C (200kV FE-TEM). Tecnai G2 12 (120kV TEM). MultiMode NanoScope V SPM. W M Keck Center for Advanced Microscopy and Microanalysis. 250V Harker Interdisciplinary Science and Engineering Laboratory. Newark, Delaware 19716. Http:/ www.camm.udel.edu/. Fees & Rates. 2017 University of Delaware.

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Training | Keck Center for Advanced Microscopy and MicroanalysisKeck Center for Advanced Microscopy and Microanalysis

http://www.camm.udel.edu/training

Keck Center for Advanced Microscopy and Microanalysis. Fees & Rates. If you haven’t registered as a user, you need to go through an online registration @ http:/ eml.masc.udel.edu/schedule/SignUp.php. And also follow steps 2 – 5 below:. Download a copy of the application and authorization form from this page. Fill in the user information and check the instruments you may use. For training, after you book your time, you need to send an email to Mr. Frank Kriss ( fkriss@udel.edu. To request for a confirmati...

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Faculty | Keck Center for Advanced Microscopy and MicroanalysisKeck Center for Advanced Microscopy and Microanalysis

http://www.camm.udel.edu/about-camm/faculty

Keck Center for Advanced Microscopy and Microanalysis. Fees & Rates. Professors in the College of Engineering who oversee the growth of the Electron Microscopy Facility include. Douglas J. Buttrey. Who is a professor in the Department of Chemical Engineering. Thomas H. Epps, III. Who is the Gutshall Professor of Chemical Engineering. David C. Martin. Who is Karl W. and Renate Böer Professor and Chair of Materials Science and Engineering. Darrin J. Pochan. George C. Hadjipanayis. Talos F200C (200kV FE-TEM).

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JSM-7400F | Keck Center for Advanced Microscopy and MicroanalysisKeck Center for Advanced Microscopy and Microanalysis

http://www.camm.udel.edu/instruments/jsm-7400f

Keck Center for Advanced Microscopy and Microanalysis. Fees & Rates. 1 kV: 1.5 nm. 15 kV: 1.0 nm. Accelerating voltage: 0.1kV-30kV. JSM-7400F high resolution scanning electron microscope. XEDS, high resolution imaging with SEI, BSE, r-filter, and gentle beam imaging modes to provide compositional and/or topographical information. 1 nm at 15 kV or 1.5 nm at 1 kV. Ultra-thin window Si-Li X-ray detector (active area = 30 mm. Capable of detecting elements with Z 4. ISE Laboratory – Room 172. Fees & Rates.

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Staff | Keck Center for Advanced Microscopy and MicroanalysisKeck Center for Advanced Microscopy and Microanalysis

http://www.camm.udel.edu/about-camm/staff

Keck Center for Advanced Microscopy and Microanalysis. Fees & Rates. Chaoying Ni, PhD. Professor, Dept. of Matls. Sci. and Engr. Director, W. M. Keck Center for Advanced Microscopy and Microanalysis. Office Location: 250V ISE Laboratory. Dept of Matls. Sci. and Engr. Newark, DE 19716. Tel (302) 831 – 6359. Tel (302) 831 – 2318. Fax (302) 831 – 4545. Send questions and comments to mailto: cni@udel.edu. Jennifer Sloppy, PhD. Office Location: 258 ISE Laboratory. Dept of Matls. Sci. and Engr. Newark, DE 19716.

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Capabilities | UD Nanofabrication Facility

http://udnf.udel.edu/capabilities

The UD Nanofabrication Facility (UDNF). Has world-class capabilities in the areas of lithography, deposition, etch, thermal processing, characterization, and device packaging. Below is a comprehensive list of our equipment and fees. Equipment details can be found here. The UDNF includes equipment and infrastructure necessary to fabricate devices at a nanometer scale. Shown here is a spectroscopic ellipsometer, which uses polarized light to characterize thin film and bulk materials. Ion Mill with SIMS.

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